기타 기업의 제품
설명
Wafer Thickness MicroGauge : IFP-801
Feautures
- Non-contact measurement
- High accuracy and repeatability
- Ultra-fast measurement speed
- User-friendly operating program
- Thinner thickness measurement
- No calibration needed
- Full surface scanning
Description
It is of great use in measurement of Thickness, TTV, Warp and Bow of various glass, transparent, light-reflected materials.
Feautures
- Non-contact measurement
- High accuracy and repeatability
- Ultra-fast measurement speed
- User-friendly operating program
- Thinner thickness measurement
- No calibration needed
- Full surface scanning
Description
It is of great use in measurement of Thickness, TTV, Warp and Bow of various glass, transparent, light-reflected materials.
Contact the seller
Wafer Thickness MicroGauge : IFP-801